Sample preparation for SEM and TEM
For TEM users:
UniMill
Fully automated ion beam thinning system for TEM/XTEM sample preparation
- Easy to use and automated operation
- Widest energy range on the market (100 eV- 16 keV)
- Automatic perforation detector
- Load-lock system for fast sample exchange
- Liquid Nitrogen cooling option
- Online monitoring and support
Gentle Mill
Ion beam workstation for final cleaning and end-polishing of highest quality TEM/FIB samples
- Automated operation
- The final step for a perfect result
- vacuum transfer shuttle
- Special adaptor for Hitachi microscopes
- Online monitoring and support
MAG*I*CAL
Traceable transmission electron microscopy calibration sample
TiDisc
Special embedding grid for TEM/XTEM samples
For SEM users:
SEMPrep2
New generation ion milling system for slope cutting and damage-free surface polishing for SEM and EBSD users.
- Easy to use and automated operation
- Widest energy range on the market
(100 eV- 16 keV) - Unique pre-tilted slop cutting sample holders (30°, 45°, 90°)
- Load-lock system for fast sample exchange
- Optional vacuum transfer unit
- Liquid nitrogen or Peltier cooling option
- Oil-free vacuum system
