Sample preparation for SEM and TEM
For SEM users:
SEMPrep Smart
New generation ion etching system for cross-sectional cuts and damage-free polishing of the sample surface for SEM and EBSD users
- Simple and automated operation
- Largest energy range on the market (<100 eV-16 keV)
- Unique pre-tilted sample holders for angled cuts (30°, 90°)
- +/- 1 µm positioning accuracy for cross-section
- Sample size up to 50mm diameter
- Load lock system for quick sample exchange
- Optional vacuum transfer unit
- Liquid nitrogen or Peltier cooling option
- Oil-free vacuum system
For TEM users:
UniMill
Fully automated ion beam thinning system for TEM/XTEM sample preparation
- Easy to use and automated operation
- Widest energy range on the market (100 eV- 16 keV)
- Automatic perforation detector
- Load-lock system for fast sample exchange
- Liquid Nitrogen cooling option
- Online monitoring and support
Gentle Mill
Ion beam workstation for final cleaning and end-polishing of highest quality TEM/FIB samples
- Automated operation
- The final step for a perfect result
- vacuum transfer shuttle
- Special adaptor for Hitachi microscopes
- Online monitoring and support
MAG*I*CAL
Traceable transmission electron microscopy calibration sample
TiDisc
Special embedding grid for TEM/XTEM samples
