CSI Nano-Observer Multiple-Mode AFM
ResiScopeTM and Soft ResiScope
Advanced Conductive Nano-Characterization
The ResiScope is the most advanced module for conductive measurements that enables conductivity measurements over 10 decades (from 100 fA to 1 mA) within one image.
Surfaces with both, highly conductive and insulating domains can be mapped overcoming undesired side-effects like probe-induced local oxidation, bimetallic effects or melting of the conductive coating.
It can be combined with several dynamic modes as MFM/EFM or KFM providing several signal channels with the same tip on the same sample area.
The Soft ResiScope enables the conductivity measurement also for the Intermittent Contact Mode.
So even for fragile and soft surfaces, conductivity maps can be acquired that would never be measurable with Contact Conductive AFM techniques
Environmental control and optical access
The Nano-Observer is designed to offer environmental control (gas, humidity…). It is compatible to all electrical modes that often require dry and oxygen-free conditions.
In addition the sample temperature can be controlled from ambient to 200°C to investigate temperature-dependent surface property changes.
Also a plug and play Liquid Cell is available. It enables liquid scanning without any additional adjustments or laser prealignment.
The compact design of the Nano-Observer further easily enables the integration into an optical analysis setup like Raman for example.