Scanning Probe Microscopy Solutions Based on Active Canilever Technology
Active Cantilevers
The Active Cantilevers have a built-in thermomechanical actuator, as well as a piezoresistive Wheatstone bridge for self- sensing.
This allows easy -to-use AFMs that do not need laser/detector, as used for optical beam-deflection based conventional AFM with passive cantilevers.
The Active Cantilevers enable high resolution imaging at ambient, opaque liquid, or vacuum environments.
Tip materials can be e.g. Silicon or diamond.
Various shapes of Active Cantilevers are tuned for specific needs, including fast imaging speed.
AFM Kit
This unique, simple and easy bold-on AFM offers flexible implentation to industrial or research set-ups, without compromise in resolution or speed.
The robust, high precision drive ensures reproducable and safe auto-approach of the tip to the sample.
The tip-scanning concept allows use with different geometries and sizes of samples.
The „plug and play“-mechanism for cantilever exchange is extremely simple.
Kronos AFM
The Kronos-AFM is a stand-alone solution to cover various operation modes:
- Scanning Probe Lithography
- Surface Roughness
- Non-Contact mode
- Contact-mode
- Profilometry
- C-AFM
AFM in SEM
The AFMinSEM is an add-on to existing SEMs. It can operate under Ambient or vacuum conditions.
SEM, FIB and AFM can operate autonomously or simultaneously. Using the SEM, the operator indentifies a region of interest, and then Measures with the AFM in 3D at sub-nm resolution.
Combined with the SEM/FIB, the AFM can be used for correlative nanofabrication.