Options & Upgrades
Continuous Stiffness Measurement (CSM)
The Continuous Stiffness Measurement (CSM) technique satisfies application requirements that must take into account dynamic effects, such as strain rate and frequency.
The CSM option offers a means of separating the in-phase and out-of-phase components of the load-displacement history. The separation provides an accurate measurement of the location of initial surface contact and continuous measurement of contact stiffness as a function of depth or frequency, thus eliminating the need for unloading cycles
AccuFilm™ Thin Film Method Pack
An InView test method based on the Hay-Crawford model for measuring substrate-independent material properties using Continuous Stiffness Measurement (CSM). AccuFilm corrects for substrate influence on film measurements for hard films on soft substrates, as well as for soft films on hard substrates.
ProbeDMA™ Polymer Method Pack
Provides the ability to measure the complex modulus of polymers as a function of frequency. The pack includes a flat-punch tip, a viscoelastic reference material, and a test method for evaluation of viscoelastic properties. This measurement technique is key to characterizing nanoscale polymers and polymer films that are not well-served by traditional dynamic mechanical analysis (DMA) test instruments.
Utilizes the InForce 50 actuator and a Berkovich tip to generate 3D maps of nanomechanical properties for high-E (> 3GPa) materials. NanoBlitz performs up to 100,000 indents (300×300 array) at < 1s per indent, and provides Young’s modulus (E), hardness (H), and stiffness (S) values at a specified load for each indent in the array. The large number of tests enables increased statistical accuracy. Histogram charts show multiple phases or materials. The NanoBlitz 3D package includes visualization and data handling capabilities.
Utilizes the InForce 50 actuator and a Berkovich tip to generate 4D maps of nanomechanical properties for both low-E/H and high-E (>3GPa) materials. NanoBlitz performs up to 10,000 indents (30×30 array) at 5-10s per indent, and provides Young’s modulus (E), hardness (H), and stiffness (S) values as a function of depth for each indent in the array. NanoBlitz 4D utilizes a constant strain rate method. The package includes visualization and data handling capabilities.
Biomaterials Method Pack
Provides the ability to measure the complex modulus of biomaterials with shear moduli in the order of 1kPa, and utilizes Continuous Stiffness Measurement (CSM). The pack includes a flat-punch tip and a test method for evaluation of viscoelastic properties. This measurement technique is key to characterizing small-scale biomaterials that are not well-served by traditional rheometer instruments.
Scratch and Wear Testing Method Pack
Involves the application of either a constant or a ramped load to an indenter while moving across the sample surface at a specified velocity. Scratch testing allows characterization of numerous materials such as thin films, brittle ceramics and polymers.
User Method Development for InView Control Software
InView is a powerful, intuitive experiment-scripting platform that can be used for designing novel or complex experiments. Experienced users can set up and perform virtually any small-scale mechanical test using the indenter system equipped with the exclusive InView option.
The precision heating stage facilitates the study of materials of interest as they are heated from room temperature to as high as 350C. To ensure reliable data, the system’s software compensates for drift associated with heating.
Expands the load capabilities up to 10 N of force, allowing the complete mechanical characterization of ceramics, bulk metals, and composites. The High Load option has been engineered to avoid sacrificing the instrument’s load and displacement resolutions at low forces while seamlessly engaging at the point in the test protocol when extra force is required.
Lateral Force Measurement
Provides three-dimensional quantitative analysis for scratch testing, wear testing, and MEMS probing. This option enables force detection in the X and Y directions to examine shear forces. Tribological studies use the LFM for determination of the critical load and coefficient of friction over the scratch length.
Utilizes the accurate, repeatable X/Y motion of the Nanoindenter G200X system to provide a maximum scan size of 500μm by 500μm. The NanoVision stage and Survey Scanning options can be used together for precise location targeting for nanoindentation tests, particularly valuable for determination of sample fracture toughness