RHK Technology

RHK Technology has been a world leading supplier of surface analysis instrumentation for over 25 years.

  • PanScan Cryogen-free LT-STM
  • PanScan LT SPM kit
  • UHV VT AFM/STM
  • UHV LT QuadraProbe(TM)
  • AFM/STM/SEM
  • PanScan Tesla SPM with magnetic fields
  • Universal SPM controls

See here the webinar regarding the R9 control elelctronics.

 

UHV VT AFM/STM

Vacuum STM or AFM/STM, ambient temperature or variable temperature; UHV- systems including sample preparation and additional analysis methods; Options for variable magnetic field and for optical access

RHK UHV 7500 mit zusätzlichen Oberflächenanalyse-Möglichkeiten und Erfassung optischer Daten

UHV AFM/STM/ SEM

Navigation of the SPM-tip under obervation by a Scanning Electron Microscope

UHV AFM/STM/REM
REM-Aufnahme der STM Spitze über einem Gold-Gitter

UHV LT QuadraProbe™

Up to 4 independent atomic resolution measuring tips, sample and tip chilled at 10 K, SEM for tip navigation

Messspitze über einem Schaltkreis
Manipulation von Nanotubes

Pan-Style LT STM / TF-AFM-Kit

Scan head for low temperature use down to 300 mK; operation in magnetic fields, STM or optional tuning fork AFM; integral x/y-offsets

Pan-Style LT STM

Pan-Scan Freedom-LT System

Turnkey system for STM or AFM/STM in the 9K -400K temperature range with closed-cycle-cooling: cryogen-cost-free and interruption-free; atomic resolution, low drift, superb STS. For further information see:
http://www.rhk-tech.com/products/panscan-freedom/

 

Images courtesy of Tapaszto Lab - Hungarian Academy of Sciences, Centre for Energy Research

Images courtesy of Tapaszto Lab – Hungarian Academy of Sciences, Centre for Energy Research

 

ATM 300/350

STM or AFM/STM for use at ambient conditions, for small scan ranges and highest resolution, prepared for upgrade to UHV

ATM 300/350

Universal SPM Control Systems

Electronics and software for different brands or homebuilt scan heads; the current models R9/R9plus offer IHDL™ with „drag and drop“- composition of the desired hardware configuration

Universelles SPM-Steuersystem
R9

PLLPro Control System for NC-AFM

Fully digital electronics and software to support all AFM modes; Newest version PLLPro 2 ™ includes Kelvin Probe Microscopy

PLLPro-Steuerung für NC-AFM

Upgrades of existing systems

The modular concept allows easy and economical paths to extended RHK systems:

From STM to AFM/STM, from RT to VT, from external to internal vibration damping, from manual PPC100 to digital PPC200, from older control system hardware and software to R9.

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